The Auriga Zeiss SEM combines a high resolution SEM to the precision milling and nanofabrication abilities of a high resolution FIB. It includes unique imaging capabilities, detection of topographical and compositional information, analysis of non-conducting materials, innovative FIB technology with resolution (<2.5 nm) and gas processing technology for ion and e-beam assisted etching and deposition.
We are interested in cross-disciplinary collaborations.
Researchers are encouraged to populate their user profiles with details pertaining to their specialized expertise and accessible research instrumentation. This facilitates enhanced discoverability and fosters potential collaborations.
Within the 'User Settings', members have the discretion to designate their profiles as 'public' or 'private'. A 'public' setting ensures visibility on the co-authors' webpage, while a 'private' designation ensures concealment from publicly accessible pages