The Zeiss Crossbeam 1540 is equiped with a field emission ion source and a Ga ion gun to locally remove material in a very precise way. This ion milling process gives the opportunity to prepare cross sections and analyze them with different analytical methods (e.g. EDX, EBSD) to characterize the sample. This means damage cases and microstructural changes can be investigated properly. Furthermore a preparation of samples for transmission electron microcopy (TEM) is possible by a cutting and lift-out method using a micromanipulator to extract a specific sample volume. Further thinning by ion milling leads to foils which are thin enough for TEM or STEM analysis. Contact us to discuss research and collaboration.